Open AccessOptical Analyses of Si and GaAs Semiconductors by Fractional-Derivative-Spectrum Methods
Author(s) -
W. Rzodkiewicz,
M. Kulik,
E. Papis,
Anna Szerling
Publication year - 2009
Publication title -
acta physica polonica. a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.217
H-Index - 38
eISSN - 1898-794X
pISSN - 0587-4246
DOI - 10.12693/aphyspola.116.s-95
Subject(s) - spectrum (functional analysis) , semiconductor , materials science , derivative (finance) , fractional calculus , condensed matter physics , compound semiconductor , optoelectronics , physics , nanotechnology , quantum mechanics , financial economics , economics , epitaxy , layer (electronics)