Open AccessMaterials Patterning and Characterisation at the Nanometre Scale Using Focused MeV Ion Beams: Present Achievements and Future Prospects
Author(s) -
G.W. Grime
Publication year - 2009
Publication title -
acta physica polonica a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.217
H-Index - 38
eISSN - 1898-794X
pISSN - 0587-4246
DOI - 10.12693/aphyspola.115.467
Subject(s) - nanometre , nanotechnology , materials science , scale (ratio) , ion , engineering physics , physics , composite material , quantum mechanics
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