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Study of Tip-Induced Ti-Film Oxidation in Atomic Force Microscopy Contact and Non-Contact Mode
Author(s) -
J. Šoltýs,
V. Cambel,
J. Fedor
Publication year - 2003
Publication title -
acta physica polonica a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.217
H-Index - 38
eISSN - 1898-794X
pISSN - 0587-4246
DOI - 10.12693/aphyspola.103.553
Subject(s) - atomic force microscopy , materials science , kelvin probe force microscope , conductive atomic force microscopy , microscopy , nanotechnology , optics , physics

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