
Nanostructure of Thin Gold Films Investigated by Means of Atomic Force Microscopy and X-Ray Reflectometry Methods
Author(s) -
D. Żymierska,
J. Auleytner,
J. Domagała,
Tomasz Kobiela,
R. Duś
Publication year - 2002
Publication title -
acta physica polonica. a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.217
H-Index - 38
eISSN - 1898-794X
pISSN - 0587-4246
DOI - 10.12693/aphyspola.102.289
Subject(s) - reflectometry , nanostructure , materials science , atomic force microscopy , thin film , nanotechnology , microscopy , x ray , optics , physics , computer science , time domain , computer vision