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Electron Microscopy and X-ray Diffraction Study of AlN Layers
Author(s) -
A. Kowalczyk,
A. Jagoda,
A. Mücklich,
W. Matz,
M. Pawłowska,
R. Ratajczak,
A. Turos
Publication year - 2002
Publication title -
acta physica polonica. a
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.217
H-Index - 38
eISSN - 1898-794X
pISSN - 0587-4246
DOI - 10.12693/aphyspola.102.221
Subject(s) - materials science , electron microscope , diffraction , x ray , x ray crystallography , electron , microscopy , optics , crystallography , physics , nuclear physics , chemistry

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