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The Focusing Characteristics on the Binary Phase Sub-wavelength Fresnel Zone Plate
Author(s) -
Taikei Suyama
Publication year - 2019
Publication title -
international journal of physics
Language(s) - English
Resource type - Journals
eISSN - 2333-4576
pISSN - 2333-4568
DOI - 10.12691/ijp-7-3-3
Subject(s) - zone plate , optics , photolithography , fresnel zone , materials science , wavelength , light intensity , depth of focus (tectonics) , etching (microfabrication) , substrate (aquarium) , bright field microscopy , intensity (physics) , microscopy , physics , geology , layer (electronics) , nanotechnology , diffraction , paleontology , oceanography , subduction , tectonics

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