Open AccessVoltage Sag Evaluation Method Based on Blind Number Mod-el of Component Reliability Parameter
Author(s) -
珊珊 胡
Publication year - 2013
Publication title -
shu pei dian gong cheng yu ji shu
Language(s) - English
Resource type - Journals
eISSN - 2325-1565
pISSN - 2325-1573
DOI - 10.12677/tdet.2013.21002
Subject(s) - mod , voltage sag , reliability (semiconductor) , component (thermodynamics) , reliability engineering , voltage , computer science , mathematics , engineering , electrical engineering , artificial intelligence , physics , power quality , power (physics) , quantum mechanics , thermodynamics