Open AccessReliability Evaluation of UPFC for Dou-ble-Circuit Lines
Author(s) -
哲敏 林
Publication year - 2018
Publication title -
smart grid
Language(s) - English
Resource type - Journals
eISSN - 2161-8771
pISSN - 2161-8763
DOI - 10.12677/sg.2018.81004
Subject(s) - reliability (semiconductor) , reliability engineering , computer science , engineering , physics , power (physics) , quantum mechanics