Open AccessThe Estimation and Properties of Reliability for Complex System under Constant-Stress Accelerated Life Tests
Author(s) -
俊丽 杨
Publication year - 2012
Publication title -
tong ji xue yu ying yong
Language(s) - English
Resource type - Journals
eISSN - 2325-226X
pISSN - 2325-2251
DOI - 10.12677/sa.2012.12003
Subject(s) - reliability (semiconductor) , estimation , constant (computer programming) , reliability engineering , stress (linguistics) , accelerated life testing , computer science , mathematics , statistics , engineering , thermodynamics , physics , weibull distribution , systems engineering , power (physics) , linguistics , philosophy , programming language