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A Characterization for Locally Projectively Flat Berwald Type (α, β)-Metrics
Author(s) -
昌涛 余
Publication year - 2015
Publication title -
pure mathematics
Language(s) - English
Resource type - Journals
eISSN - 2160-7583
pISSN - 2160-7605
DOI - 10.12677/pm.2015.54023
Subject(s) - characterization (materials science) , type (biology) , mathematics , geology , physics , paleontology , optics

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