Open AccessAnalysis of the Key Technology and Developing Trend of the Hall Chip
Author(s) -
文毫 徐
Publication year - 2014
Publication title -
dian lu yu xi tong
Language(s) - English
Resource type - Journals
eISSN - 2327-0853
pISSN - 2327-0861
DOI - 10.12677/ojcs.2014.34011
Subject(s) - key (lock) , chip , hall effect , engineering physics , computer science , electrical engineering , engineering , computer security , electrical resistivity and conductivity