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Fourier Transform Profilometry Based on Zero Frequency Elimination
Author(s) -
星宇 徐
Publication year - 2017
Publication title -
optoelectronics
Language(s) - Uncategorized
Resource type - Journals
eISSN - 2164-5450
pISSN - 2164-5469
DOI - 10.12677/oe.2017.72011
Subject(s) - profilometer , fourier transform , optics , structured light 3d scanner , measure (data warehouse) , frame (networking) , zero (linguistics) , grating , phase (matter) , spatial frequency , range (aeronautics) , computer science , physics , mathematics , materials science , mathematical analysis , linguistics , philosophy , surface roughness , composite material , telecommunications , scanner , quantum mechanics , database

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