
Application of X-Ray Dual Crystal Diffraction in Semiconductor Materials and Structure Analysis
Author(s) -
关志强,
唐吉龙,
魏志鹏,
牛守柱,
方铉,
房丹,
王登魁,
贾慧民,
王晓华
Publication year - 2018
Publication title -
cai liao ke xue
Language(s) - English
Resource type - Journals
eISSN - 2160-7613
pISSN - 2160-7621
DOI - 10.12677/ms.2018.81005
Subject(s) - materials science , dual (grammatical number) , semiconductor , crystallography , optoelectronics , chemistry , art , literature