z-logo
open-access-imgOpen Access
Application of X-Ray Dual Crystal Diffraction in Semiconductor Materials and Structure Analysis
Author(s) -
志强 关
Publication year - 2018
Publication title -
material sciences
Language(s) - English
Resource type - Journals
eISSN - 2160-7613
pISSN - 2160-7621
DOI - 10.12677/ms.2018.81005
Subject(s) - materials science , dual (grammatical number) , semiconductor , crystallography , optoelectronics , chemistry , art , literature

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom