Open AccessValidation and Reliability of the Chinese Version of Immersed Tendency Questionnaire
Author(s) -
Yu Tian,
卞玉龙,
韩丕国,
李晓岳,
王鹏,
高峰强
Publication year - 2015
Publication title -
xin li xue jin zhan
Language(s) - English
Resource type - Journals
eISSN - 2160-7273
pISSN - 2160-7281
DOI - 10.12677/ap.2015.56050
Subject(s) - reliability (semiconductor) , psychology , reliability engineering , applied psychology , computer science , engineering , physics , thermodynamics , power (physics)