A Study of Improving the Reliability of VE Process
Author(s) -
Sung-In Shin,
Sungkwon Woo,
SungHo Jin,
Seok-In Choi
Publication year - 2016
Publication title -
journal of the korean society of civil engineers
Language(s) - English
Resource type - Journals
eISSN - 2287-934X
pISSN - 1015-6348
DOI - 10.12652/ksce.2016.36.5.0881
Subject(s) - objectification , reliability (semiconductor) , process (computing) , function (biology) , point (geometry) , value (mathematics) , computer science , management science , risk analysis (engineering) , psychology , process management , epistemology , engineering , business , mathematics , philosophy , power (physics) , physics , geometry , quantum mechanics , evolutionary biology , machine learning , biology , operating system
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