Open AccessAcceptance sampling reliability test plans for alpha distributed lifetime
Author(s) -
Maroof A. Khan,
H. M. Islam
Publication year - 2013
Publication title -
brazilian journal of probability and statistics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.441
H-Index - 18
eISSN - 2317-6199
pISSN - 0103-0752
DOI - 10.1214/11-bjps181
Subject(s) - sampling (signal processing) , reliability (semiconductor) , test plan , mathematics , acceptance sampling , reliability engineering , test (biology) , statistics , sampling design , computer science , engineering , weibull distribution , sample size determination , power (physics) , paleontology , population , physics , demography , filter (signal processing) , quantum mechanics , sociology , computer vision , biology
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