Open AccessDealumination of ZSM-5 — Characterization by TPD, DTA/DTG, XPS and Adsorption Measurements
Author(s) -
E. Alsdorf,
M. Feist,
H. FichtnerSchmittler,
Th. Groß,
H.-J. Jerschkewitz,
U. Lohse,
B. Parlitz
Publication year - 1988
Publication title -
adsorption science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.682
H-Index - 36
eISSN - 2048-4038
pISSN - 0263-6174
DOI - 10.1177/026361748800500204
Subject(s) - chemistry , adsorption , aluminium , x ray photoelectron spectroscopy , zsm 5 , analytical chemistry (journal) , inorganic chemistry , molecular sieve , chemical engineering , organic chemistry , engineering
A series of ZSM 5 samples obtained by dealumination is studied by TPD, DTA/DTG, XPS and adsorption measurements. The amount of adsorbed water at p/p 0 ≦ 0.1 and the amount of chemisorbed NH 3 corresponding to the TPD peak at 693–723 K correlate with the number of framework aluminium atoms per unit cell. At strong dealumination an enrichment of non-framework aluminium in the surface layers of the crystals was found. The HZSM-57 zeolites are transformed into silicalite-like samples during the course of the DTA experiment in the temperature range 973–1273 K.