Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra | Zendy

David M. Surmick | Zendy; Hacène Boukari | Zendy; Jonathan Woodward | Zendy; Ashley C. Stowe | Zendy; Noureddine Melikechi | Zendy

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Uncertainty of Integrated Intensity Following Line Profile Fitting of Multiline Spectra

Author(s) -

David M. Surmick,

Hacène Boukari,

Jonathan Woodward,

Ashley C. Stowe,

Noureddine Melikechi

Publication year - 2018

Publication title -

applied spectroscopy

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.415

H-Index - 110

eISSN - 1943-3530

pISSN - 0003-7028

DOI - 10.1177/0003702818756652

Subject(s) - weighting , intensity (physics) , emission spectrum , spectral line , computational physics , line (geometry) , radiant intensity , measurement uncertainty , emission intensity , laser , optics , physics , mathematics , radiation , statistics , geometry , astronomy , acoustics , photoluminescence

A novel method of determining the total uncertainty in the integrated intensity of fitted emission lines in multipeaked emission spectra is presented. The proposed method does not require an assumption of the type of line profile to be specified. The absolute difference between a fit and measured spectrum defines the uncertainty of the integrated signal intensity and is subsequently decomposed to determine the uncertainty of each peak in multiline fits. Decomposition relies on tabulating a weighting factor, which describes how each peak contributes to the total integral uncertainty. Applications of this method to quantitative approaches in laser-induced breakdown spectroscopy analysis are described.

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