Open AccessFault modeling and parametric fault detection in analog VLSI circuits using discretization
Author(s) -
Baldev Raj,
G. Mohiuddin Bhat,
Sandeep Thakur
Publication year - 2019
Publication title -
international journal of electrical and computer engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.277
H-Index - 22
ISSN - 2088-8708
DOI - 10.11591/ijece.v9i3.pp1598-1605
Subject(s) - computer science , very large scale integration , parametric statistics , matlab , fault (geology) , electronic circuit , flexibility (engineering) , fault tolerance , network analysis , equivalent circuit , software , electronic engineering , embedded system , electrical engineering , engineering , mathematics , distributed computing , programming language , statistics , voltage , seismology , geology , operating system
In this article we describe new model for determination of fault in circuit and also we provide detailed analysis of tolerance of circuit, which is considered one of the important parameter while designing the circuit. We have done mathematical analysis to provide strong base for our model and also done simulation for the same. This article describes detailed analysis of parametric fault in analog VLSI circuit. The model is tested for different frequencies for compactness and its flexibility. The tolerance analysis is also done for this purpose. All the simulation are done in MATLAB software.