Open AccessAn approach to Measure Transition Density of Binary Sequences for X-filling based Test Pattern Generator in Scan based Design
Author(s) -
Sabir Hussain,
V. Malleshwara Rao
Publication year - 2018
Publication title -
international journal of electrical and computer engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.277
H-Index - 22
ISSN - 2088-8708
DOI - 10.11591/ijece.v8i4.pp2063-2071
Subject(s) - benchmark (surveying) , binary number , algorithm , generator (circuit theory) , computer science , shift register , mathematical proof , computation , cryptosystem , span (engineering) , measure (data warehouse) , electronic circuit , topology (electrical circuits) , power (physics) , mathematics , arithmetic , cryptography , data mining , electrical engineering , engineering , physics , geometry , geodesy , quantum mechanics , civil engineering , geography , combinatorics
Switching activity and Transition density computation is an essential stage for dynamic power estimation and testing time reduction. The study of switching activity, transition densities and weighted switching activities of pseudo random binary sequences generated by Linear Feedback shift registers and Feed Forward shift registers plays a crucial role in design approaches of Built-In Self Test, cryptosystems, secure scan designs and other applications. This paper proposed an approach to find transition densities, which plays an important role in choosing of test pattern generator We have analyze conventional and proposed designs using our approache, This work also describes the testing time of benchmark circuits. The outcome of this paper is presented in the form of algorithm, theorems with proofs and analyses table which strongly support the same. The proposed algorithm reduces switching activity and testing time up to 51.56% and 84.61% respectively.