On the Use of Polycrystal and Individual Orientation Texture Analysis Methods for BCC Materials
Author(s) -
I.V. Gervasyeva,
Б. К. Соколов,
A. K. Sbitnev
Publication year - 1995
Publication title -
texture stress and microstructure
Language(s) - English
Resource type - Journals
eISSN - 1687-5400
pISSN - 1687-5397
DOI - 10.1155/tsm.25.109
Subject(s) - materials science , texture (cosmology) , orientation (vector space) , crystallography , metallurgy , geometry , computer science , artificial intelligence , mathematics , chemistry , image (mathematics)
The reliability of the harmonic method of the ODF calculation from X-ray pole figures was estimatedfor cubic symmetry materials. For this purpose simulated textures with a preset scattering value of thecomponents were used. Some examples using the Roe method to the study of the secondaryrecrystallization process in the Fe-3% Si alloy are given. The capabilities of the etch-pits methods asthe simplest discrete method used to determine the orientation density are discussed.
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