Determination of Dielectric Constant of Stearic Acid Films Using Varying Gap Immersion Method | Zendy

Varsha Agarwal | Zendy; Bunjirō Ichijō | Zendy

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Determination of Dielectric Constant of Stearic Acid Films Using Varying Gap Immersion Method

Author(s) -

Varsha Agarwal,

Bunjirō Ichijō

Publication year - 1977

Publication title -

active and passive electronic components

Language(s) - English

Resource type - Journals

eISSN - 1026-7034

pISSN - 0882-7516

DOI - 10.1155/apec.4.23

Subject(s) - stearic acid , immersion (mathematics) , dielectric , materials science , composite material , analytical chemistry (journal) , chemistry , chromatography , mathematics , optoelectronics , mathematical analysis

The dielectric constant data (at 3.5 MHz) on stearic acid thin films, obtained by using variable gap immersion method, are presented. Many of the errors of the conventional universal bridge method are eliminated in the method used here. It is also shown that the varying gap immersion method serves as an experimental tool for simultaneous determination of film thickness with high degree of accuracy. The data on evaporated as well as Langmuir films of stearic acid (≥1000 Å) are found to be consistent and in reasonable agreement.

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