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Optimal Partial Reconfiguration for Permanent Fault Recovery on SRAM-Based FPGAs in Space Mission
Author(s) -
Jie Zhang,
Yong Guan,
Chunjing Mao
Publication year - 2013
Publication title -
advances in mechanical engineering/advances in mechanical engineering
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.318
H-Index - 40
eISSN - 1687-8140
pISSN - 1687-8132
DOI - 10.1155/2013/783673
Subject(s) - control reconfiguration , static random access memory , field programmable gate array , embedded system , computer science , fault (geology) , real time computing , computer hardware , seismology , geology
In this paper, we present a technique to maximize the lifetime of SRAM-based FPGAs in space mission. We focus on recovering permanent faults induced by SEE (single-events effect). In our technique, we use a fix-sized fault detection module to detect permanent faults and propose a permanent fault recovery mechanism for fault recovery. By using partial reconfiguration, we develop a system lifetime estimation model to find the optimal partition for designing the module-based fault recovering with the maximum system lifetime. We conduct experiments with a set of real applications including SpaceWire, Wavelet, AC97, MEPG-4, 8086, and Ethernet on Xilinx XUP platforms. The experimental results show our technique can effectively improve the lifetime compared with the previous work.

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