Modeling Cascading Failure of Thermal Runaway in Stacks of Li-Ion Pouch Cells with Variation in Cooling Attributes
Author(s) -
Randy Shurtz,
John C. Hewson
Publication year - 2018
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2018-01/3/369
Subject(s) - thermal runaway , nuclear engineering , thermal , heat transfer , environmental science , thermal energy , materials science , aerospace engineering , mechanics , battery (electricity) , meteorology , thermodynamics , engineering , physics , power (physics)
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