(Invited) Measurement of the Energy-Band Relations of Stabilized Si Photoanodes Using Operando Ambient Pressure X-ray Photoelectron Spectroscopy | Zendy

Matthias H. Richter | Zendy; Michael F. Lichterman | Zendy; Shu Hu | Zendy; Ethan J. Crumlin | Zendy; Thomas Mayer | Zendy; Stephanus Axnanda | Zendy; Marco Favaro | Zendy; Walter S. Drisdell | Zendy; Z. Hussain | Zendy; Bruce S. Brunschwig | Zendy; Nathan S. Lewis | Zendy; Zhi Liu | Zendy; H. J. Lewerenz | Zendy

Open Access

(Invited) Measurement of the Energy-Band Relations of Stabilized Si Photoanodes Using Operando Ambient Pressure X-ray Photoelectron Spectroscopy

Author(s) -

Matthias H. Richter,

Michael F. Lichterman,

Shu Hu,

Ethan J. Crumlin,

Thomas Mayer,

Stephanus Axnanda,

Marco Favaro,

Walter S. Drisdell,

Z. Hussain,

Bruce S. Brunschwig,

Nathan S. Lewis,

Zhi Liu,

H. J. Lewerenz

Publication year - 2015

Publication title -

meeting abstracts/meeting abstracts (electrochemical society. cd-rom)

Language(s) - English

Resource type - Journals

eISSN - 2151-2035

pISSN - 1091-8213

DOI - 10.1149/ma2015-01/19/1306

Subject(s) - x ray photoelectron spectroscopy , band bending , semiconductor , photoelectrochemistry , band gap , materials science , spectroscopy , analytical chemistry (journal) , optoelectronics , chemistry , physics , electrode , electrochemistry , nuclear magnetic resonance , quantum mechanics , chromatography

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