Open AccessCharacterization of Reliability in SiC Power Devices
Author(s) -
Jack Flicker,
David Russell Hughart,
Stan Atcitty,
Robert Kaplar,
Matthew Marinella
Publication year - 2014
Publication title -
meeting abstracts/meeting abstracts (electrochemical society. cd-rom)
Language(s) - English
Resource type - Journals
eISSN - 2151-2035
pISSN - 1091-8213
DOI - 10.1149/ma2014-02/40/1966
Subject(s) - materials science , silicon carbide , optoelectronics , mosfet , power semiconductor device , wide bandgap semiconductor , engineering physics , reliability (semiconductor) , power mosfet , capacitor , electrical engineering , voltage , power (physics) , composite material , transistor , engineering , physics , quantum mechanics
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