Open AccessExtraction of Bias-dependent Source and Drain Resistances in AlGaN/GaN MIS-HEMTs Using Pulsed Measurement Method
Author(s) -
Kun-Ming Chen,
Chun-Hsiung Lin,
BoYuan Chen,
Guo–Wei Huang,
Edward Yi Chang
Publication year - 2022
Publication title -
ecs journal of solid state science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.488
H-Index - 51
eISSN - 2162-8777
pISSN - 2162-8769
DOI - 10.1149/2162-8777/ac7661
Subject(s) - materials science , optoelectronics , transconductance , transistor , trapping , voltage , biasing , semiconductor , electrical engineering , ecology , biology , engineering