z-logo
open-access-imgOpen Access
Erratum: Mass Transfer Limited KOH Etching in Crystalline Silicon using a Confinement Mask [ ECS J. Solid State Sci. Technol. 9, 034013 (2020)]
Author(s) -
Kristianto Tjiptowidjojo,
Seok Jun Han,
Sang Eon Han,
Sang M. Han,
Peter Randall Schunk
Publication year - 2022
Publication title -
ecs journal of solid state science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.488
H-Index - 51
eISSN - 2162-8777
pISSN - 2162-8769
DOI - 10.1149/2162-8777/ac59c8
Subject(s) - materials science , solid state , etching (microfabrication) , optoelectronics , nanotechnology , engineering physics , engineering , layer (electronics)

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom