Open AccessEditors’ Choice—Effects of Parasitic Elements of Interconnection Lines in CNT Embedded Integrated Circuits
Author(s) -
Roberto Marani,
Anna Gina Perri
Publication year - 2020
Publication title -
ecs journal of solid state science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.488
H-Index - 51
eISSN - 2162-8777
pISSN - 2162-8769
DOI - 10.1149/2162-8777/ab69b2
Subject(s) - interconnection , electronic circuit , materials science , carbon nanotube , integrated circuit , electronic engineering , nanotechnology , optoelectronics , electrical engineering , computer science , telecommunications , engineering
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