Planar Ohmic Contacts to Al0.45Ga0.55N/Al0.3Ga0.7N High Electron Mobility Transistors
Author(s) -
Brianna Klein,
Albert G. Baca,
Andrew Armstrong,
Andrew A. Allerman,
Carlos Anthony Sanchez,
E Douglas,
Mary H. Crawford,
Mary Ann Miller,
Paul G. Kotula,
Torben R. Fortune,
Vincent M. Abate
Publication year - 2017
Publication title -
ecs journal of solid state science and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.488
H-Index - 51
eISSN - 2162-8777
pISSN - 2162-8769
DOI - 10.1149/2.0181711jss
Subject(s) - ohmic contact , materials science , contact resistance , annealing (glass) , transistor , electron mobility , schottky diode , schottky barrier , optoelectronics , transmission electron microscopy , planar , sheet resistance , analytical chemistry (journal) , metallurgy , nanotechnology , diode , layer (electronics) , electrical engineering , chemistry , computer graphics (images) , engineering , voltage , chromatography , computer science
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