Influence of the Mobility of Pt Nanoparticles on the Anisotropic Etching Properties of Silicon
Author(s) -
Xiaopeng Li,
Ying Xiao,
Cheng Yan,
Keya Zhou,
Stefan L. Schweizer,
Alexander Sprafke,
J.-H. Lee,
Ralf B. Wehrspohn
Publication year - 2012
Publication title -
ecs solid state letters
Language(s) - English
Resource type - Journals
eISSN - 2162-8742
pISSN - 2162-8750
DOI - 10.1149/2.010302ssl
Subject(s) - materials science , etching (microfabrication) , silicon , isotropic etching , nanotechnology , nanoparticle , schottky barrier , metal , electrokinetic phenomena , reactive ion etching , optoelectronics , chemical engineering , metallurgy , layer (electronics) , engineering , diode
Metal-assisted chemical etching (MaCE) has been shown to be a powerful and cost-effective method for surface nano-texturing and silicon micromachining. Since the motion of a metal catalyst during the etching process determines the etched morphology, understanding the mobility of the metal catalysts would enable precise control of the silicon structuring. Through the investigation of Pt nanoparticle (PtNP)-induced etching of silicon, we find that the Schottky barrier height of the metal-Si contacts strongly influences the charge transfer process during the etching. Consequently, the motion of the PtNPs is affected, which is different from previous understandings based on an electrokinetic model
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