Oxygen Reduction at La0.5Sr0.5Mno3 Thin Film/Yttria Stabilized Zirconia Interface Studied by Impedance Spectroscopy
Author(s) -
Thierry Pagnier
Publication year - 1993
Publication title -
ecs proceedings volumes
Language(s) - English
Resource type - Journals
eISSN - 2576-1579
pISSN - 0161-6374
DOI - 10.1149/199304.0575pv
Subject(s) - dielectric spectroscopy , materials science , electrode , yttria stabilized zirconia , electrical impedance , polarization (electrochemistry) , thin film , oxygen , analytical chemistry (journal) , cubic zirconia , chemistry , composite material , nanotechnology , electrochemistry , electrical engineering , ceramic , organic chemistry , chromatography , engineering
Accelerating Research
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom
Address
John Eccles HouseRobert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom