z-logo
open-access-imgOpen Access
Characterization of NiO/YSZ Electrode by Temperature-Programmed Reduction
Author(s) -
Toshiyuki Shirakawa
Publication year - 1993
Publication title -
ecs proceedings volumes
Language(s) - English
Resource type - Journals
eISSN - 2576-1579
pISSN - 0161-6374
DOI - 10.1149/199304.0464pv
Subject(s) - non blocking i/o , cermet , nickel oxide , nickel , materials science , yttria stabilized zirconia , electrode , electrical resistivity and conductivity , conductivity , oxide , chemical engineering , metallurgy , inorganic chemistry , catalysis , chemistry , ceramic , electrical engineering , cubic zirconia , biochemistry , engineering

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom