z-logo
open-access-imgOpen Access
Effect of Substrate Oxygen Content on Smart Power ICS Yield. Intrinsic Gettering Effectiveness and Denuded Zone Calculation
Author(s) -
Flavio Francesco Villa
Publication year - 1989
Publication title -
ecs proceedings volumes
Language(s) - English
Resource type - Journals
eISSN - 2576-1579
pISSN - 0161-6374
DOI - 10.1149/198915.0228pv
Subject(s) - getter , wafer , yield (engineering) , materials science , substrate (aquarium) , oxygen , transistor , optoelectronics , electronic engineering , electrical engineering , chemistry , metallurgy , engineering , geology , oceanography , organic chemistry , voltage

The content you want is available to Zendy users.

Already have an account? Click here to sign in.
Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom