Open AccessCommunication—A Fast and Accurate Numerical Technique for Impedance Spectroscopy of Microstructures
Author(s) -
Narasimhan Swaminathan,
Sundararajan Natarajan,
Ean Tat Ooi
Publication year - 2022
Publication title -
journal of the electrochemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.258
H-Index - 271
eISSN - 1945-7111
pISSN - 0013-4651
DOI - 10.1149/1945-7111/ac51a2
Subject(s) - finite element method , grain boundary , dielectric spectroscopy , electrical impedance , crystallite , degrees of freedom (physics and chemistry) , spectroscopy , element (criminal law) , materials science , microstructure , physics , structural engineering , engineering , composite material , metallurgy , thermodynamics , electrode , electrochemistry , quantum mechanics , political science , law
The polygonal finite element method (PFEM) is proposed as a fast and accurate technique to simulate the impedance spectroscopy (IS) of polycrystalline materials. While conventional finite element method (FEM) requires explicit meshing of the grains and grain boundaries, in PFEM each region can be treated as an element. We demonstrate that the number of degrees of freedom in PFEM can be lower by a factor of 30 when compared to FEM, thus speeding up simulations by a factor of 3.5. A simple example demonstrates the use of PFEM to generate IS on samples with various grain boundary widths.