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The Early-Stage Corrosion of Copper Materials in Chloride and Sulfide Solutions: Nanoscale Characterization and The Effect of Microstructure
Author(s) -
Mengnan Guo,
K. Daub,
Qingshan Dong,
Fei Long,
W. Jeffrey Binns,
Mark R. Daymond,
David W. Shoesmith,
James J. Noël,
S.Y. Persaud
Publication year - 2022
Publication title -
journal of the electrochemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.258
H-Index - 271
eISSN - 1945-7111
pISSN - 0013-4651
DOI - 10.1149/1945-7111/ac4bf4
Subject(s) - microstructure , materials science , corrosion , copper , crystallite , metallurgy , sulfide , scanning electron microscope , grain boundary , polarization (electrochemistry) , transmission electron microscopy , analytical chemistry (journal) , composite material , chemistry , nanotechnology , chromatography
The microstructures of copper (Cu) materials were investigated by electron backscatter diffraction, showing that electrodeposited (ED) Cu has a homogenous polycrystalline microstructure, while cold spray (CS) Cu has a heterogeneous microstructure with varying grain size, pores, and interfacial splat regions. The corrosion rate was examined by corrosion potential (E CORR ) and polarization resistance (R p ) measurements on Cu specimens in solutions containing 0.1 M NaCl + 1 × 10 −3 M Na 2 S. Although the as sprayed CS-Cu was the least corrosion resistant, the corrosion rate of the heat-treated CS-Cu was similar to that of the ED-Cu and wrought Cu (SKB-Cu). Electrochemical behaviours of Cu materials were investigated by either a potentiodynamic scan or a potentiostatic polarization at a more positive potential (E > E CORR ) for various experiment durations up to 4 h, showing that the heat-treated CS-Cu, SKB-Cu and ED-Cu exhibited very similar behaviour while the as sprayed CS-Cu showed erratic behavior consistent with a variable surface reactivity. Nanoscale scanning transmission electron microscopy analysis has been performed at the cross-section of an anodically-oxidized CS-Cu specimen, revealing a two-layer film structure, mostly composed of Cu sulfide, with a minor diffusion of sulfur in the local area of an interfacial splat boundary tip.

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