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In-Situ Investigation of SOFC Patterned Electrodes using Ambient-Pressure X-ray Photoelectron Spectroscopy
Author(s) -
Anthony H. McDaniel,
Farid El Gabaly,
E. A. Akhadov,
Roger L. Farrow,
Kevin F. McCarty,
Mark Linne,
Steven C. DeCaluwe,
Chunjuan Zhang,
Bryan W. Eichhorn,
Gregory S. Jackson,
Zhi Liu,
Michael Graß,
Z. Hussain,
Hendrik Bluhm
Publication year - 2009
Publication title -
ecs transactions
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.235
H-Index - 52
eISSN - 1938-6737
pISSN - 1938-5862
DOI - 10.1149/1.3205541
Subject(s) - x ray photoelectron spectroscopy , ambient pressure , materials science , electrode , electrolyte , polarization (electrochemistry) , synchrotron , dielectric spectroscopy , analytical chemistry (journal) , electrochemistry , anode , in situ , thin film , single crystal , chemical engineering , nanotechnology , optics , chemistry , crystallography , physics , chromatography , organic chemistry , engineering , thermodynamics

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