Open AccessInducing and Imaging Localized Passivity Breakdown in Aluminum Using an AFM Approach
Author(s) -
Kevin R. Zavadil
Publication year - 2008
Publication title -
ecs transactions
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.235
H-Index - 52
eISSN - 1938-6737
pISSN - 1938-5862
DOI - 10.1149/1.2925259
Subject(s) - nanoscopic scale , materials science , millisecond , polarization (electrochemistry) , atomic force microscopy , grain boundary , aluminium , passivity , atomic units , oxide , conductive atomic force microscopy , aluminum oxide , chemical physics , nanotechnology , composite material , chemistry , metallurgy , microstructure , physics , quantum mechanics , astronomy , engineering , electrical engineering
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