Mott‐Schottky Analysis of Nanometer‐Scale Thin‐Film Anatase TiO2
Author(s) -
Roel van de Krol,
A. Goossens,
J. Schoonman
Publication year - 1997
Publication title -
journal of the electrochemical society
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 1.258
H-Index - 271
eISSN - 1945-7111
pISSN - 0013-4651
DOI - 10.1149/1.1837668
Subject(s) - anatase , nanometre , materials science , evaporation , indium tin oxide , dielectric , schottky barrier , thin film , oxide , schottky diode , indium , electron beam physical vapor deposition , nanotechnology , analytical chemistry (journal) , optoelectronics , composite material , chemistry , metallurgy , thermodynamics , physics , biochemistry , chromatography , photocatalysis , diode , catalysis
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