Open Access(Invited) Comprehensive Assessment of Oxide Memristors As Post-CMOS Memory and Logic Devices
Author(s) -
Xujiao Gao,
Denis Mamaluy,
Eric C. Cyr,
Matthew Marinella
Publication year - 2016
Publication title -
ecs transactions
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.235
H-Index - 52
eISSN - 1938-6737
pISSN - 1938-5862
DOI - 10.1149/07203.0049ecst
Subject(s) - memristor , cmos , reset (finance) , materials science , hysteresis , voltage , resistive random access memory , switching time , electronic engineering , scaling , computer science , electrical engineering , optoelectronics , physics , engineering , condensed matter physics , geometry , mathematics , financial economics , economics
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