Open AccessSimilarities between Ionizing Radiation Effects and Negative-Bias Temperature Instability (NBTI) in MOSFET Devices
Author(s) -
Harold P. Hjalmarson,
Duc Anh Nguyen,
Kenneth E. Kambour,
Camron Kouhestani,
R. A. B. Devine
Publication year - 2013
Publication title -
ecs transactions
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.235
H-Index - 52
eISSN - 1938-6737
pISSN - 1938-5862
DOI - 10.1149/05807.0049ecst
Subject(s) - negative bias temperature instability , instability , mosfet , materials science , ionizing radiation , radiation , hydrogen , condensed matter physics , irradiation , nuclear physics , physics , transistor , mechanics , quantum mechanics , voltage
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