Open AccessPreparation and properties of 0.5BiFeO3–0.5PbFe0.5Nb0.5O3 ceramics and polycrystalline films
Author(s) -
K. M. Zhidel,
A. V. Pavlenko
Publication year - 2021
Publication title -
journal of advanced dielectrics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.38
H-Index - 13
eISSN - 2010-135X
pISSN - 2010-1368
DOI - 10.1142/s2010135x2160002x
Subject(s) - materials science , crystallite , formula unit , tetragonal crystal system , texture (cosmology) , substrate (aquarium) , dielectric , analytical chemistry (journal) , layer (electronics) , crystallography , phase (matter) , nanotechnology , physics , optoelectronics , crystal structure , image (mathematics) , quantum mechanics , chemistry , oceanography , chromatography , geology , computer science , metallurgy , artificial intelligence
In this paper, we report the successful growth of 0.5BiFeO 3 –0.5[Formula: see text][Formula: see text]O 3 /SrTiO 3 /Si(001) heterostructure using RF-cathode sputtering in an oxygen atmosphere. The deposited films have been investigated by X-ray diffractometry and spectroscopic ellipsometry (SE). 0.5BiFeO 3 –0.5[Formula: see text][Formula: see text]O 3 films on silicon substrates with a strontium titanate buffer layer are single-phase, polycrystalline with a texture in the 001 direction. The unit cell parameters calculated in the tetragonal approximation were [Formula: see text] = 4.005 ± 0.001 [Formula: see text]; [Formula: see text] = 3.995 ± 0.001 [Formula: see text]. The presence in the films of small unit cell deformation arising from different unit cells parameters of the film and substrate is observed. Dielectric properties and capacitance-voltage characteristics have been measured. The ellipsometric parameters have been obtained.