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Synthesis and characterization of strontium-doped barium titanate thin film by dip and dry technique
Author(s) -
S. G. Chavan,
A. N. Tarale,
D. J. Salunkhe
Publication year - 2021
Publication title -
journal of advanced dielectrics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.38
H-Index - 13
eISSN - 2010-135X
pISSN - 2010-1368
DOI - 10.1142/s2010135x21500028
Subject(s) - materials science , dielectric , thin film , crystallite , dielectric loss , raman spectroscopy , microstructure , permittivity , dip coating , dielectric spectroscopy , doping , grain size , strontium titanate , analytical chemistry (journal) , composite material , coating , optics , optoelectronics , nanotechnology , metallurgy , chemistry , physics , chromatography , electrode , electrochemistry
Thin films of polycrystalline (Ba[Formula: see text][Formula: see text]TiO 3 ([Formula: see text] = 0.2 and 0.3) with Perovskite structure were prepared by a dip and dry technique on a platinum-coated silicon substrate. The good quality thin films with uniform microstructure and thickness were successfully produced by dip-coating techniques annealed at 730[Formula: see text]C for 1 h. The resulting thin film shows a well-developed dense polycrystalline structure with more uniform grain size distribution. The BST thin films were characterized for their structural, Raman spectroscopy, morphological properties, and complex impedance properties. The dielectric constant-frequency curve showed the good dielectric constant and loss dielectric loss with low-frequency dispersion. The BST 0.3 thin film reveals that the dielectric constant and dielectric loss at a frequency of 1 kHz were 578 and 0.02, respectively. The obtained results on dielectric properties can be analyzed in terms of the Maxwell–Wagner model.