Incidence and Characteristics of Beta Radiation Survivors ( Escherichia coli )
Author(s) -
Won Young Koh,
Catherine T. Morehouse,
Velma L. Chandler
Publication year - 1956
Publication title -
applied microbiology
Language(s) - English
Resource type - Journals
ISSN - 0003-6919
DOI - 10.1128/am.4.3.153-155.1956
Subject(s) - incidence (geometry) , escherichia coli , beta (programming language) , microbiology and biotechnology , biology , physics , computer science , genetics , optics , gene , programming language
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