Extreme ultraviolet metalens by vacuum guiding
Author(s) -
Marcus Ossiander,
Maryna L. Meretska,
Hana Kristin Hampel,
Soon Wei Daniel Lim,
Nico Knefz,
Thomas Jauk,
Federico Capasso,
Martin Schultze
Publication year - 2023
Publication title -
science
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 12.556
H-Index - 1186
eISSN - 1095-9203
pISSN - 0036-8075
DOI - 10.1126/science.adg6881
Subject(s) - extreme ultraviolet lithography , extreme ultraviolet , optics , attosecond , lithography , optoelectronics , materials science , physics , x ray optics , wavelength , wavefront , metrology , laser , ultrashort pulse , x ray
Extreme ultraviolet (EUV) radiation is a key technology for material science, attosecond metrology, and lithography. Here, we experimentally demonstrate metasurfaces as a superior way to focus EUV light. These devices exploit the fact that holes in a silicon membrane have a considerably larger refractive index than the surrounding material and efficiently vacuum-guide light with a wavelength of ~50 nanometers. This allows the transmission phase at the nanoscale to be controlled by the hole diameter. We fabricated an EUV metalens with a 10-millimeter focal length that supports numerical apertures of up to 0.05 and used it to focus ultrashort EUV light bursts generated by high-harmonic generation down to a 0.7-micrometer waist. Our approach introduces the vast light-shaping possibilities provided by dielectric metasurfaces to a spectral regime that lacks materials for transmissive optics.
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