Electron Microscopy: Enhancement of Specimen Contrast by Injection of Atoms | Zendy

John H. Manley | Zendy

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Electron Microscopy: Enhancement of Specimen Contrast by Injection of Atoms

Author(s) -

John H. Manley

Publication year - 1967

Publication title -

science

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 12.556

H-Index - 1186

eISSN - 1095-9203

pISSN - 0036-8075

DOI - 10.1126/science.158.3808.1585

Subject(s) - electron microscope , materials science , range (aeronautics) , substrate (aquarium) , electron , microscopy , scanning electron microscope , contrast (vision) , etching (microfabrication) , optics , nanotechnology , physics , composite material , nuclear physics , oceanography , layer (electronics) , geology

Injections of biological specimens and substrates with cesium were made with a small accelerator in the energy range of 20 to 1000 electron volts. Subsequent electron microscopic examination demonstrated that the contrast and appearance of the specimen depend on its structure and on the energy of injection. Substrate noise is decreased over conventional contrasting techniques. The same accelerator provides controlled etching of the specimen.

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