Open AccessDirect measurement of nanoscale filamentary hot spots in resistive memory devices
Author(s) -
Sanchit Deshmukh,
Miguel Muñoz Rojo,
Eilam Yalon,
Sam Vaziri,
Çağıl Köroğlu,
Raisul Islam,
Ricardo A. Iglesias,
Krishna C. Saraswat,
Eric Pop
Publication year - 2022
Publication title -
science advances
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 5.928
H-Index - 146
ISSN - 2375-2548
DOI - 10.1126/sciadv.abk1514
Subject(s) - resistive random access memory , neuromorphic engineering , nanoscopic scale , materials science , nanotechnology , resistive touchscreen , electrode , graphene , optoelectronics , thermal conductivity , electrical engineering , computer science , composite material , physics , engineering , quantum mechanics , machine learning , artificial neural network
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