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Influence of electron contamination on in vivo surface dosimetry for high‐energy photon beams
Author(s) -
Sjögren Rickard,
Karlsson Mikael
Publication year - 1998
Publication title -
medical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.473
H-Index - 180
eISSN - 2473-4209
pISSN - 0094-2405
DOI - 10.1118/1.598270
Subject(s) - dosimetry , contamination , diode , cathode ray , electron , photon , materials science , optics , atomic physics , optoelectronics , physics , nuclear medicine , nuclear physics , medicine , ecology , biology
The influence of the electron contamination at in vivo dosimetry with diodes on the patient surface has been investigated by introducing different accessories in the beam path and by changing the field size and SSD. The results show a clear correlation between the electron contamination at an effective measuring depth of the diode and the signal from the patient diode. When the electron contamination is taken into account the agreement between the diode values and the absorbed dose is greatly improved. More accurate in vivo dosimetry with less error margins is therefore possible if better predictions of the electron contamination in high‐energy photon beams can be performed.