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Processor quality control in laser imaging systems
Author(s) -
Bogucki T. M.,
Murphy W. R.,
Baker C. W.,
Piazza S. S.,
Haus A. G.
Publication year - 1997
Publication title -
medical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.473
H-Index - 180
eISSN - 2473-4209
pISSN - 0094-2405
DOI - 10.1118/1.597940
Subject(s) - laser , optics , materials science , far infrared laser , x ray laser , diode , infrared , optoelectronics , laser power scaling , physics
Sensitometric techniques for performing processor quality control in laser imaging systems are analyzed in this study. The sensitivity of conventional x‐ray films using simulated screen‐light sensitometry is compared with helium–neon (HeNe) laser film exposed with a simulated red‐light sensitometer, a standalone (reference) laser sensitometer, an experimental (unstable) laser sensitometer, and laser printers. Infrared (IR) laser film exposed with an IR laser diode and a simulated IR sensitometer are also evaluated. It is demonstrated that laser‐generated step tablets provide an easy and reliable method of performing laser film processor quality control.