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Highly stable solid‐state x‐ray detector array
Author(s) -
Takahashi Tetsuhiko,
Nakagawa Manabu,
Yoshida Minoru,
Takeuchi Hiroshi
Publication year - 1992
Publication title -
medical physics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.473
H-Index - 180
eISSN - 2473-4209
pISSN - 0094-2405
DOI - 10.1118/1.596919
Subject(s) - detector , imaging phantom , image resolution , optics , materials science , x ray detector , scintillator , offset (computer science) , image quality , photon counting , temperature coefficient , photodiode , resolution (logic) , physics , computer science , composite material , artificial intelligence , image (mathematics) , programming language
A detailed analysis of the effects of temperature changes, over time and between array elements, on the generation of circular artifacts in images produced by x‐ray computed tomography was reported. We give formulas for calculating—according to the x‐ray energy, detector sensitivity, and observed image quality (contrast and spatial resolution)—the maximum offset temperature coefficient and maximum gain temperature coefficient that will allow circular‐artifact‐free imaging. A temperature‐controlled and insulated solid‐state x‐ray detector array, consisting of Gd 2 O 2 S:Pr,Ce,F ceramic scintillators coupled to crystal Si pin‐photodiodes and designed to meet the requirements for these coefficients, produced high‐resolution artifacts‐free CT images of a phantom head.